Linseis offers a product lineup for the measurement of the thermal and electrical transport properties of thin films from the nanometer to the micrometer in a wide range of temperatures.
The TFA – Thin Film Analyzer, chip-based platform simultaneously measures a thin film’s thermal conductivity, in-plane electrical conductivity, Seebeck coefficient and Hall constant from -170°C up to 280°C and in a magnetic field of up to 1 T.
The TF-LFA, using LaserFlash technology measures the thermal diffusivity of materials (FDTR – Frequency-domain thermoreflectance). This optical measurement technique allows the characterization of nm to µm thin films and coatings as well as the characterization of high conductive bulk materials.
The HCS - Hall Characterization System with a permanent or electromagnet measures the electrical transport properties (Resistivity, Hall Constant, Charge Carrier Concentration, Hall Mobility) of thin films or bulk samples in a temperature range from -196°C up to +700°C.
The LSR – measures thin film Resistivity and Seebeck Coefficient from -100°C up to +1500°C. The device can be equipped with adapters for thin films, free standing films and foils as well as an adapter to measure zT directly, using the Harman technique.
The LFA – LaserFlash Analyzer, measures the thermal diffusivity of thicker films and coatings in the tens to hundreds of µm range. Measurements up to temperatures of +2800°C.
https://www.linseis.com/en/products/thin-film-analyzer/